Thin liquid films studied by atomic force microscopy

Bonaccurso, Elmar; Kappl, Michael; Butt, Hans-Jürgen

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Thin liquid films studied by atomic force microscopy

Bonaccurso, E., Kappl, M., & Butt, H.-J. (2008). Thin liquid films studied by atomic force microscopy. Current Opinion in Colloid & Interface Science, 13(3), 107-119.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-79A4-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-79A5-9

Genre: Journal Article

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Creators:
Bonaccurso, Elmar¹, Author
Kappl, Michael¹, Author
Butt, Hans-Jürgen¹, Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 2008

Publication Status: Issued

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Identifiers: eDoc: 367775
Other: P-08-312

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Title: Current Opinion in Colloid & Interface Science

Alternative Title : Curr. Opin. Colloid Interface Sci.

Source Genre: Journal

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Pages: - Volume / Issue: 13 (3) Sequence Number: - Start / End Page: 107 - 119 Identifier: -