Electrical Scanning Probe Microscopy of an Integrated Blocking Layer

Weber, S. A. L.; Memesa, M.; Berger, Rüdiger; Butt, Hans-Jürgen; Gutmann, Jochen S.

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Electrical Scanning Probe Microscopy of an Integrated Blocking Layer

Weber, S. A. L., Memesa, M., Berger, R., Butt, H.-J., & Gutmann, J. S. (2010). Electrical Scanning Probe Microscopy of an Integrated Blocking Layer. Journal of Nanoscience and Nanotechnology, 10(10), 6840-6844.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-7303-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-7304-7

Genre: Journal Article

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Creators:
Weber, S. A. L.¹, Author
Memesa, M.¹, Author
Berger, Rüdiger¹, Author
Butt, Hans-Jürgen¹, Author
Gutmann, Jochen S.¹, Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 2010

Publication Status: Issued

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Identifiers: eDoc: 493351
Other: P-10-116

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Title: Journal of Nanoscience and Nanotechnology

Alternative Title : J. Nanosci. Nanotechnol.

Source Genre: Journal

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Pages: - Volume / Issue: 10 (10) Sequence Number: - Start / End Page: 6840 - 6844 Identifier: -