In-situ Film Diagnostics during Plasma Polymerisation Using Waveguide Mode 
Spectroscopy

Jacobsen, V.; Menges, B.; Scheller, Andreas; Förch, Renate; Mittler, Silvia; Knoll, Wolfgang

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In-situ Film Diagnostics during Plasma Polymerisation Using Waveguide Mode Spectroscopy

Jacobsen, V., Menges, B., Scheller, A., Förch, R., Mittler, S., & Knoll, W. (2001). In-situ Film Diagnostics during Plasma Polymerisation Using Waveguide Mode Spectroscopy. Surface and Coatings Technology, 142-144, 1105-1108.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-692E-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-692F-3

Genre: Journal Article

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Creators:
Jacobsen, V.¹, Author
Menges, B.¹, Author
Scheller, Andreas, Author
Förch, Renate¹, Author
Mittler, Silvia¹, Author
Knoll, Wolfgang¹, Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 2001

Publication Status: Issued

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Identifiers: eDoc: 271605
Other: P-01-116

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Title: Surface and Coatings Technology

Source Genre: Journal

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Pages: - Volume / Issue: 142-144 Sequence Number: - Start / End Page: 1105 - 1108 Identifier: -