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Abstract:
The technique of scanning small-angle X-ray scattering with a microsized beam (SM-SAXS) has been used to study crack propagation in poly(methyl methacrylate) (PMMA). Two pieces of PMMA are welded together, and the creation of defect structures is followed in the energy dissipation zone at the end of a crack tip at the PMMA-PMMA interface by SM-SAXS. The defect region is scanned in two dimensions perpendicular to the crack propagation with a 10 μm beam. At each position the SAXS pattern is obtained on an area detector which provides information on defect contrast, distribution, and orientation around the crack. From this investigation detailed structural information at micrometer spatial resolution is available, providing a microscopic image of the crack zone.
