A method to correct defocused element distribution maps in electron probe 
microanalysis

Kluckner, M.; Brandl, O.; Weinbruch, S.; Stadermann, F. J.; Ortner, H. M.

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A method to correct defocused element distribution maps in electron probe microanalysis

Kluckner, M., Brandl, O., Weinbruch, S., Stadermann, F. J., & Ortner, H. M. (1997). A method to correct defocused element distribution maps in electron probe microanalysis. Mikrochimica Acta, 125(1-4), 229-234.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-595E-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-595F-B

Genre: Journal Article

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Creators:
Kluckner, M., Author
Brandl, O.¹, Author
Weinbruch, S., Author
Stadermann, F. J., Author
Ortner, H. M., Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Free keywords: electron probe microanalysis; element distribution mapping

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Language(s): eng - English

Dates: Date issued: 1997

Publication Status: Issued

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Identifiers: eDoc: 429207

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Title: Mikrochimica Acta

Alternative Title : Mikrochim. Acta

Source Genre: Journal

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Pages: - Volume / Issue: 125 (1-4) Sequence Number: - Start / End Page: 229 - 234 Identifier: -