The inverse electromechanical effect in mechanically oriented S-C*-elastomers 
examined by means of an ultra-stable Michelson interferometer

Lehmann, W.; Gattinger, P.; Keck, M.; Kremer, F.; Stein, P.; Eckert, T.; Finkelmann, H.

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The inverse electromechanical effect in mechanically oriented S-C*-elastomers examined by means of an ultra-stable Michelson interferometer

Lehmann, W., Gattinger, P., Keck, M., Kremer, F., Stein, P., Eckert, T., et al. (1998). The inverse electromechanical effect in mechanically oriented S-C*-elastomers examined by means of an ultra-stable Michelson interferometer. Ferroelectrics, 208(1-4), 373-383.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-5741-E Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-5742-C

Genre: Journal Article

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Creators:
Lehmann, W., Author
Gattinger, P., Author
Keck, M., Author
Kremer, F.¹, Author
Stein, P., Author
Eckert, T., Author
Finkelmann, H., Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 1998

Publication Status: Issued

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Identifiers: eDoc: 564406

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Title: Ferroelectrics

Alternative Title : Ferroelectrics

Source Genre: Journal

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Pages: - Volume / Issue: 208 (1-4) Sequence Number: - Start / End Page: 373 - 383 Identifier: -