Refractive Index and Thickness Determination of Monolayers by Multi Mode 
Waveguide Coupled Surface Plasmons

Weisser, M.; Menges, B.; Mittler-Neher, Silvia

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Refractive Index and Thickness Determination of Monolayers by Multi Mode Waveguide Coupled Surface Plasmons

Weisser, M., Menges, B., & Mittler-Neher, S. (1999). Refractive Index and Thickness Determination of Monolayers by Multi Mode Waveguide Coupled Surface Plasmons. Sensors and Actuators B-Chemical, 56, 189-197.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-53BD-9 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-53BE-7

Genre: Journal Article

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Creators:
Weisser, M.¹, Author
Menges, B.¹, Author
Mittler-Neher, Silvia¹, Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 1999

Publication Status: Issued

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Identifiers: eDoc: 324427
Other: P-99-99

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Title: Sensors and Actuators B-Chemical

Source Genre: Journal

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Pages: - Volume / Issue: 56 Sequence Number: - Start / End Page: 189 - 197 Identifier: -