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  Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements

Barty, A., Caleman, C., Aquila, A., Timneanu, N., Lomb, L., White, T. A., et al. (2011). Self-terminating diffraction gates femtosecond X-ray nanocrystallography measurements. Nature Photonics, 6(1), 35-40. doi:10.1038/nphoton.2011.297.

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Barty, Anton, Autor
Caleman, Carl, Autor
Aquila, Andrew, Autor
Timneanu, Nicusor, Autor
Lomb, Lukas, Autor
White, Thomas A., Autor
Andreasson, Jakob, Autor
Arnlund, David, Autor
Bajt, Saša, Autor
Barends, Thomas R. M., Autor
Barthelmess, Miriam, Autor
Bogan, Michael J., Autor
Bostedt, Christoph, Autor
Bozek, John D., Autor
Coffee, Ryan, Autor
Coppola, Nicola, Autor
Davidsson, Jan, Autor
DePonte, Daniel P., Autor
Doak, R. Bruce, Autor
Ekeberg, Tomas, Autor
Elser, Veit, AutorEpp, S. W.1, Autor           Erk, Benjamin1, Autor           Fleckenstein, Holger, AutorFoucar, Lutz, AutorFromme, Petra, AutorGraafsma, Heinz, AutorGumprecht, Lars, AutorHajdu, Janos, AutorHampton, Christina Y., AutorHartmann, Robert, AutorHartmann, Andreas, AutorHauser, Günter, AutorHirsemann, Helmut, AutorHoll, Peter, AutorHunter, Mark S., AutorJohansson, Linda, AutorKassemeyer, Stephan, AutorKimmel, Nils, AutorKirian, Richard A., AutorLiang, Mengning, AutorMaia, Filipe R. N. C., AutorMalmerberg, Erik, AutorMarchesini, Stefano, AutorMartin, Andrew V., AutorNass, Karol, AutorNeutze, Richard, AutorReich, Christian, AutorRolles, Daniel, AutorRudek, Benedikt1, Autor           Rudenko, Artem1, Autor           Scott, Howard, AutorSchlichting, Ilme, AutorSchulz, Joachim, AutorSeibert, M. Marvin, AutorShoeman, Robert L., AutorSierra, Raymond G., AutorSoltau, Heike, AutorSpence, John C. H., AutorStellato, Francesco, AutorStern, Stephan, AutorStrüder, Lothar, AutorUllrich, Joachim1, Autor           Wang, X., AutorWeidenspointner, Georg, AutorWeierstall, Uwe, AutorWunderer, Cornelia B., AutorChapman, Henry N., Autor mehr..
Affiliations:
1Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547              

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 Zusammenfassung: X-ray free-electron lasers have enabled new approaches to the structural determination of protein crystals that are too small or radiation-sensitive for conventional analysis1. For sufficiently short pulses, diffraction is collected before significant changes occur to the sample, and it has been predicted that pulses as short as 10 fs may be required to acquire atomic-resolution structural information1, 2, 3, 4. Here, we describe a mechanism unique to ultrafast, ultra-intense X-ray experiments that allows structural information to be collected from crystalline samples using high radiation doses without the requirement for the pulse to terminate before the onset of sample damage. Instead, the diffracted X-rays are gated by a rapid loss of crystalline periodicity, producing apparent pulse lengths significantly shorter than the duration of the incident pulse. The shortest apparent pulse lengths occur at the highest resolution, and our measurements indicate that current X-ray free-electron laser technology5 should enable structural determination from submicrometre protein crystals with atomic resolution.

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Sprache(n): eng - English
 Datum: 2011-12-18
 Publikationsstatus: Online veröffentlicht
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: DOI: 10.1038/nphoton.2011.297
 Art des Abschluß: -

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Titel: Nature Photonics
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: -
Seiten: - Band / Heft: 6 (1) Artikelnummer: - Start- / Endseite: 35 - 40 Identifikator: ISSN: 1749-4885
CoNE: https://pure.mpg.de/cone/journals/resource/1000000000240270