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  High-precision laser-assisted absolute determination of x-ray diffraction angles

Kubicek, K., Braun, J., Bruhns, H., Crespo López-Urrutia, J., Mokler, P. H., & Ullrich, J. (2012). High-precision laser-assisted absolute determination of x-ray diffraction angles. Review of scientific instruments, 83(1): 013102, pp. 1-8.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-451D-F Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-451E-D
Genre: Zeitschriftenartikel

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externe Referenz:
http://dx.doi.org/10.1063/1.3662412 (Verlagsversion)
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Urheber

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 Urheber:
Kubicek, K.1, Autor           
Braun, J.1, Autor           
Bruhns, H.1, Autor           
Crespo López-Urrutia, J.R.1, Autor           
Mokler, P. H.1, Autor           
Ullrich, J.1, Autor           
Affiliations:
1Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547              

Inhalt

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Schlagwörter: -
 Zusammenfassung: A novel technique for absolute wavelength determination in high-precision crystal x-ray spectroscopy recently introduced has been upgraded reaching unprecedented accuracies. The method combines visible laser beams with the Bond method, where Bragg angles (θ and −θ) are determined without any x-ray reference lines. Using flat crystals this technique makes absolute x-ray wavelength measurements feasible even at low x-ray fluxes. The upgraded spectrometer has been used in combination with first experiments on the 1s2p1P1 → 1s2 1S0 w- line in He-like argon. By resolving a minute curvature of the x-ray lines the accuracy reaches there the best ever reported value of 1.5 ppm. The result is sensitive to predicted second-order QED contributions at the level of two-electron screening and two-photon radiative diagrams and will allow for the first time to benchmark predicted binding energies for He-like ions at this level of precision.

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Sprache(n): eng - English
 Datum: 2012-01-04
 Publikationsstatus: Online veröffentlicht
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: -
 Art des Abschluß: -

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Quelle 1

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Titel: Review of scientific instruments
Genre der Quelle: Zeitschrift
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: Woodbury, N.Y. [etc.] : American Institute of Physics
Seiten: - Band / Heft: 83 (1) Artikelnummer: 013102 Start- / Endseite: 1 - 8 Identifikator: ISSN: 0034-6748
CoNE: https://pure.mpg.de/cone/journals/resource/991042742033452