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  Analysis of the broadening of X-ray photoelectron spectroscopy peaks for ionic crystals

Nelin, C. J., Bagus, P. S., Brown, M. A., Sterrer, M., & Freund, H.-J. (2011). Analysis of the broadening of X-ray photoelectron spectroscopy peaks for ionic crystals. Angewandte Chemie International Edition, 50(43), 10174-10177. doi:10.1002/anie.201100964.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-427A-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-741B-8
Genre: Journal Article

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 Creators:
Nelin, Connie J. 1, Author
Bagus, Paul S.2, Author
Brown, Matthew A.3, Author           
Sterrer, Martin3, Author           
Freund, Hans-Joachim3, Author           
Affiliations:
1Nelin Consulting, Austin, USA, ou_persistent22              
2Department of Chemistry, University of North Texas, Denton, USA, ou_persistent22              
3Chemical Physics, Fritz Haber Institute, Max Planck Society, Berlin, DE, ou_24022              

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Language(s): eng - English
 Dates: 2011-06-202011-10-17
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1002/anie.201100964
 Degree: -

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Title: Angewandte Chemie International Edition
  Other : Angewandte Chemie - International Edition
  Abbreviation : Angew. Chem. Int. Ed.
Source Genre: Journal
 Creator(s):
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Publ. Info: Weinheim : Wiley-VCH Verlag GmbH & Co. KGaA
Pages: 4 Volume / Issue: 50 (43) Sequence Number: - Start / End Page: 10174 - 10177 Identifier: CoNE: https://pure.mpg.de/cone/journals/resource/201310171