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  3D Model Acquisition Including Reflection Properties

Lensch, H. P. A., Kautz, J., Goesele, M., & Seidel, H.-P. (2001). 3D Model Acquisition Including Reflection Properties. In D. W. Fellner, N. Fuhr, & I. Witten (Eds.), Proceedings of the ECDL Workshop Generalized Documents (pp. 1-6). Darmstadt: Selbstverlag.

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 Creators:
Lensch, Hendrik P. A.1, Author           
Kautz, Jan1, Author           
Goesele, Michael1, Author           
Seidel, Hans-Peter1, Author           
Affiliations:
1Computer Graphics, MPI for Informatics, Max Planck Society, ou_40047              

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 Abstract: The measurement of accurate material properties is an important step towards the inclusion of realistic objects in digital documents. Many real-world objects are composed of a number of materials with subtle changes even within a single material. We present an image-based measuring method that robustly detects the different materials of real objects and fits an average bidirectional reflectance distribution function (BRDF) to each of them. In order to model the local changes as well, we project the measured data for each surface point into a basis formed by the recovered BRDFs leading to a truly spatially varying BRDF representation. A compact, high quality model of a real object can be generated with relatively few input data.

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Language(s): eng - English
 Dates: 2010-03-122001
 Publication Status: Issued
 Pages: -
 Publishing info: Darmstadt : Selbstverlag
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 520228
Other: Local-ID: C125675300671F7B-4054AA66E1012AB6C1256AB1002986CF-Lensch:2001:3MA
 Degree: -

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Title: Untitled Event
Place of Event: Darmstadt, Germany
Start-/End Date: 2001

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Title: Proceedings of the ECDL Workshop Generalized Documents
Source Genre: Proceedings
 Creator(s):
Fellner, Dieter W., Editor
Fuhr, Norbert, Editor
Witten, Ian, Editor
Affiliations:
-
Publ. Info: Darmstadt : Selbstverlag
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1 - 6 Identifier: -