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  3D scattered data approximation with adaptive compactly supported radial basis functions

Ohtake, Y., Belyaev, A., & Seidel, H.-P. (2004). 3D scattered data approximation with adaptive compactly supported radial basis functions. In Shape Modeling International 2004 (SMI 2004) (pp. 31-39). Los Alamitos, USA: IEEE.

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 Urheber:
Ohtake, Yutaka1, Autor           
Belyaev, Alexander1, Autor           
Seidel, Hans-Peter1, Autor           
Giannini, Franca, Herausgeber
Pasko, Alexander, Herausgeber
Affiliations:
1Computer Graphics, MPI for Informatics, Max Planck Society, ou_40047              

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Schlagwörter: -
 Zusammenfassung: In this paper, we develop an adaptive RBF fitting procedure for a high quality approximation of a set of points scattered over a piecewise smooth surface. We use compactly supported RBFs whose centers are randomly chosen from the points. The randomness is controlled by the point density and surface geometry. For each RBF, its support size is chosen adaptively according to surface geometry at a vicinity of the RBF center. All these lead to a noise-robust high quality approximation of the set. We also adapt our basic technique for shape reconstruction from registered range scans by taking into account measurement confidences. Finally, an interesting link between our RBF fitting procedure and partition of unity approximations is established and discussed.

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Sprache(n): eng - English
 Datum: 2005-04-272004
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: Los Alamitos, USA : IEEE
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: eDoc: 231941
Anderer: Local-ID: C125675300671F7B-01FB2D4B5B4C2508C1256FAF0037848B-smi04obs
 Art des Abschluß: -

Veranstaltung

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Titel: Untitled Event
Veranstaltungsort: Genova, Italy
Start-/Enddatum: 2004-06-07

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Titel: Shape Modeling International 2004 (SMI 2004)
Genre der Quelle: Konferenzband
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: Los Alamitos, USA : IEEE
Seiten: - Band / Heft: - Artikelnummer: - Start- / Endseite: 31 - 39 Identifikator: ISBN: 0-7695-2075-8