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  Feature Sensitive Mesh Segmentation with Mean Shift

Yamauchi, H., Lee, S., Lee, Y., Ohtake, Y., Belyaev, A., & Seidel, H.-P. (2005). Feature Sensitive Mesh Segmentation with Mean Shift. In Shape Modeling International 2005 (SMI 2005) (pp. 236-243). Los Alamitos, USA: IEEE.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-2693-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-2694-E
Genre: Conference Paper

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smi05yllobs.pdf (Any fulltext), 743KB
 
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 Creators:
Yamauchi, Hitoshi1, Author           
Lee, Seungyong1, Author           
Lee, Yunjin1, Author           
Ohtake, Yutaka1, Author           
Belyaev, Alexander1, Author           
Seidel, Hans-Peter1, Author           
Spagnuolo, Michaela, Editor
Pasko, Alexander, Editor
Belyaev, Alexander1, Editor           
Affiliations:
1Computer Graphics, MPI for Informatics, Max Planck Society, ou_40047              

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 Abstract: Feature sensitive mesh segmentation is important for many computer graphics and geometric modeling applications. In this paper, we develop a mesh segmentation method which is capable of producing high-quality shape partitioning. It respects fine shape features and works well on various types of shapes, including natural shapes and mechanical parts. The method combines a procedure for clustering mesh normals with a modification of the mesh chartification technique \cite{Sander_sig03}. For clustering of mesh normals, we adapt Mean Shift, a powerful general purpose technique for clustering scattered data. We demonstrate advantages of our method by comparing it with two state-of-the-art mesh segmentation techniques.

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Language(s): eng - English
 Dates: 2006-04-252005
 Publication Status: Issued
 Pages: -
 Publishing info: Los Alamitos, USA : IEEE
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 278961
Other: Local-ID: C125675300671F7B-40645AA425C269E4C1256FC60056CA4F-Yamauchi:FSMS:2005
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Title: Untitled Event
Place of Event: Cambridge, MA, USA
Start-/End Date: 2005-06-15

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Title: Shape Modeling International 2005 (SMI 2005)
Source Genre: Proceedings
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Publ. Info: Los Alamitos, USA : IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 236 - 243 Identifier: ISBN: 0-7695-2379-X