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  Fast and Robust Detection of Crest Lines on Meshes

Yoshizawa, S., Belyaev, A., & Seidel, H.-P. (2005). Fast and Robust Detection of Crest Lines on Meshes. In Proceedings of the Ninth ACM Symposium on Solid and Physical Modeling 2005 (pp. 227-232). New York, USA: ACM.

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 Urheber:
Yoshizawa, Shin1, Autor           
Belyaev, Alexander1, Autor           
Seidel, Hans-Peter1, Autor           
Kobbelt, Leif2, Herausgeber
Shapiro, Vadim2, Herausgeber
Affiliations:
1Computer Graphics, MPI for Informatics, Max Planck Society, ou_40047              
2Max Planck Society, ou_persistent13              

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Schlagwörter: -
 Zusammenfassung: We propose a fast and robust method for detecting crest lines on surfaces approximated by dense triangle meshes. The crest lines, salient surface features defined via first- and second-order curvature derivatives, are widely used for shape matching and interrogation purposes. Their practical extraction is difficult because it requires good estimation of high-order surface derivatives. Our approach to the crest line detection is based on estimating the curvature tensor and curvature derivatives via local polynomial fitting. Since the crest lines are not defined in the surface regions where the surface focal set (caustic) degenerates, we introduce a new thresholding scheme which exploits interesting relationships between curvature extrema, the so-called MVS functional of Moreton and Sequin, and Dupin cyclides, An application of the crest lines to adaptive mesh simplification is also considered.

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Sprache(n): eng - English
 Datum: 2006-04-252005
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: New York, USA : ACM
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: eDoc: 278956
Anderer: Local-ID: C125675300671F7B-B689675F69641AFCC1256FC000660260-Yoshizawa_spm05
 Art des Abschluß: -

Veranstaltung

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Titel: Untitled Event
Veranstaltungsort: Cambridge, Massachusetts, USA
Start-/Enddatum: 2005-06-13

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Titel: Proceedings of the Ninth ACM Symposium on Solid and Physical Modeling 2005
Genre der Quelle: Konferenzband
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: New York, USA : ACM
Seiten: - Band / Heft: - Artikelnummer: - Start- / Endseite: 227 - 232 Identifikator: ISBN: 1-59593-015-9