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  Extracting higher order critical points and topological simplification of 3D vector fields

Weinkauf, T., Theisel, H., Shi, K., Hege, H.-C., & Seidel, H.-P. (2005). Extracting higher order critical points and topological simplification of 3D vector fields. In IEEE Visualization 2005 (VIS 2005) (pp. 559-566). Los Alamitos, USA: IEEE.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-267D-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-267E-2
Genre: Conference Paper

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 Creators:
Weinkauf, Tino, Author
Theisel, Holger1, Author           
Shi, Kuangyu1, Author           
Hege, Hans-Christian, Author
Seidel, Hans-Peter1, Author           
Silva, Cláudio T., Editor
Gröller, Eduard, Editor
Rushmeier, Holly, Editor
Affiliations:
1Computer Graphics, MPI for Informatics, Max Planck Society, ou_40047              

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Language(s): eng - English
 Dates: 2006-04-252005
 Publication Status: Issued
 Pages: -
 Publishing info: Los Alamitos, USA : IEEE
 Table of Contents: -
 Rev. Type: -
 Identifiers: eDoc: 278965
Other: Local-ID: C125675300671F7B-C6C2757EF16879D8C1257050003CF30A-Weinkauf05
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Title: Untitled Event
Place of Event: http://vis.computer.org/vis2005/index.html
Start-/End Date: 2005-10-23

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Title: IEEE Visualization 2005 (VIS 2005)
Source Genre: Proceedings
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Publ. Info: Los Alamitos, USA : IEEE
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 559 - 566 Identifier: -