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  Ensembles for Normal and Surface Reconstructions

Yoon, M., Lee, Y., Lee, S., Ivrissimtzis, I., & Seidel, H.-P. (2006). Ensembles for Normal and Surface Reconstructions. In Geometric Modeling and Processing - GMP 2006, 4th International Conference, (pp. 17-33). Berlin, Germany: Springer.

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 Urheber:
Yoon, Mincheol, Autor
Lee, Yunjin1, Autor           
Lee, Seungyong1, Autor           
Ivrissimtzis, Ioannis1, Autor           
Seidel, Hans-Peter1, Autor           
Kim, Myung-Soo, Herausgeber
Shimada, Kenji, Herausgeber
Affiliations:
1Computer Graphics, MPI for Informatics, Max Planck Society, ou_40047              

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Schlagwörter: -
 Zusammenfassung: The majority of the existing techniques for surface reconstruction and the closely related problem of normal estimation are deterministic. Their main advantages are the speed and, given a reasonably good initial input, the high quality of the reconstructed surfaces. Nevertheless, their deterministic nature may hinder them from effectively handling incomplete data with noise and outliers. In our previous work [1], we applied a statistical technique, called ensembles, to the problem of surface reconstruction. We showed that an ensemble can improve the performance of a deterministic algorithm by putting it into a statistics based probabilistic setting. In this paper, with several experiments, we further study the suitability of ensembles in surface reconstruction, and also apply ensembles to normal estimation. We experimented with a widely used normal estimation technique [2] and Multi-level Partitions of Unity implicits for surface reconstruction [3], showing that normal and surface ensembles can successfully be combined to handle noisy point sets.

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Sprache(n): eng - English
 Datum: 2007-04-032006
 Publikationsstatus: Erschienen
 Seiten: -
 Ort, Verlag, Ausgabe: -
 Inhaltsverzeichnis: -
 Art der Begutachtung: -
 Identifikatoren: eDoc: 314602
Anderer: Local-ID: C125675300671F7B-1FFB74D454097852C12572980033D598-SeidelYLLI2006
 Art des Abschluß: -

Veranstaltung

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Titel: Untitled Event
Veranstaltungsort: Pittsburgh, PA, USA
Start-/Enddatum: 2006-07-26

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Quelle 1

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Titel: Geometric Modeling and Processing - GMP 2006, 4th International Conference,
Genre der Quelle: Konferenzband
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: Berlin, Germany : Springer
Seiten: - Band / Heft: - Artikelnummer: - Start- / Endseite: 17 - 33 Identifikator: ISBN: 3-540-36711-X

Quelle 2

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Titel: Lecture Notes in Computer Science
Genre der Quelle: Reihe
 Urheber:
Affiliations:
Ort, Verlag, Ausgabe: -
Seiten: - Band / Heft: 4077 Artikelnummer: - Start- / Endseite: - Identifikator: -