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  Adaptive sampling of reflectance fields

Fuchs, M., Blanz, V., Lensch, H. P. A., & Seidel, H.-P. (2007). Adaptive sampling of reflectance fields. ACM Transactions on Graphics, 26(2), 10.1-18. doi:10.1145/1243980.1243984.

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Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-1DDC-C Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-1DDD-A
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Permission to make digital or hard copies of part or all of this work for personal or classroom use is granted without fee provided that copies are not made or distributed for profit or direct commercial advantage and that copies show this notice on the first page or initial screen of a display along with the full citation. Copyrights for components of this work owned by others than ACM must be honored. Abstracting with credit is permitted. To copy otherwise, to republish, to post on servers, to redistribute to lists, or to use any component of this work in other works requires prior specific permission and /or a fee. Permissions may be requested from Publications Dept., ACM, Inc., 2 Penn Plaza, Suite 701, New York, NY 10121-0701 USA, fax +1 (212) 869-0481, or permissions@acm.org. (c) 2007 ACM 0730-0301/2007/06-ART10 $5.00 DOI 10.1145/1243980.1243984 http://doi.acm.org/10.1145/1243980.1243984
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 Urheber:
Fuchs, Martin1, Autor           
Blanz, Volker1, Autor           
Lensch, Hendrik P. A.1, Autor           
Seidel, Hans-Peter1, Autor           
Affiliations:
1Computer Graphics, MPI for Informatics, Max Planck Society, ou_40047              

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 Zusammenfassung: Image-based relighting achieves high quality in rendering, but it requires a large number of measurements of the reflectance field. This article discusses sampling techniques that improve on the trade-offs between measurement effort and reconstruction quality. Specifically, we (i) demonstrate that sampling with point lights and from a sparse set of incoming light directions creates artifacts which can be reduced significantly by employing extended light sources for sampling, (ii) propose a sampling algorithm which incrementally chooses light directions adapted to the properties of the reflectance field being measured, thus capturing significant features faster than fixed-pattern sampling, and (iii) combine reflectance fields from two different light domain resolutions. We present an automated measurement setup for well-defined angular distributions of the incident, indirect illumination. It is based on programmable spotlights with controlled aperture that illuminate the walls around the scene.

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Sprache(n): eng - English
 Datum: 2008-03-132007
 Publikationsstatus: Erschienen
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 Ort, Verlag, Ausgabe: -
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 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: eDoc: 356536
DOI: 10.1145/1243980.1243984
Anderer: Local-ID: C12573CC004A8E26-137EDB39E9A2266BC1257364004C99E6-Fuchs2007a
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Titel: ACM Transactions on Graphics
Genre der Quelle: Zeitschrift
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Seiten: - Band / Heft: 26 (2) Artikelnummer: - Start- / Endseite: 10.1 - 18 Identifikator: ISSN: 0730-0301