Electron density dependence of intensity ratio for FeXXII extreme ultraviolet 
emission lines arising from different ground levels in electron beam ion trap 
and large helical device

Sakaue, H. A.; Yamamoto, N.; Morita, S.; Nakamura, N.; Chen, C.; Kato, D.; Kikuchi, H.; Murakami, I.; Ohtani, S.; Tanuma, H.; Watanabe, T.; Tawara, Hiroyuki

doi:10.1063/1.3549707

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Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device

Sakaue, H. A., Yamamoto, N., Morita, S., Nakamura, N., Chen, C., Kato, D., et al. (2011). Electron density dependence of intensity ratio for FeXXII extreme ultraviolet emission lines arising from different ground levels in electron beam ion trap and large helical device. Journal of Applied Physcis, 109(7): 073304. doi:10.1063/1.3549707.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-134C-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-134D-B

Genre: Journal Article

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Creators:
Sakaue, H. A.¹, Author
Yamamoto, N.¹, Author
Morita, S.¹, Author
Nakamura, N.¹, Author
Chen, C.¹, Author
Kato, D.¹, Author
Kikuchi, H.¹, Author
Murakami, I.¹, Author
Ohtani, S.¹, Author
Tanuma, H.¹, Author
Watanabe, T.¹, Author
Tawara, Hiroyuki², Author

Affiliations:
1External Organizations, ou_persistent22
2Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547

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Free keywords: B-4945-2011

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Dates: Created: 2011Date issued: 2011

Publication Status: Issued

Pages: 9

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Rev. Type: -

Identifiers: ISI: 000289949000019
DOI: 10.1063/1.3549707

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Title: Journal of Applied Physcis

Source Genre: Journal

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Publ. Info: New York, NY : American Institute of Physics

Pages: - Volume / Issue: 109 (7) Sequence Number: 073304 Start / End Page: - Identifier: ISSN: 0021-8979
CoNE: https://pure.mpg.de/cone/journals/resource/991042723401880_1