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  Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals

Ray, C., Braeuning-Demian, A., Braeuning, H., Chevallier, M., Cohen, C., Dauvergne, D., et al. (2011). Measurements of high energy loss rates of fast highly charged U ions channeled in thin silicon crystals. Physical review B, 84(2): 024119. doi:10.1103/PhysRevB.84.024119.

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Ray, C.1, Author
Braeuning-Demian, A.1, Author
Braeuning, H.1, Author
Chevallier, M.1, Author
Cohen, C.1, Author
Dauvergne, D.1, Author
L'Hoir, A.1, Author
Kozhuharov, C.1, Author
Liesen, D.1, Author
Mokler, P. H.2, Author           
Poizat, J. -C.1, Author
Stoehlker, Th1, Author
Testa, E.1, Author
Toulemonde, M.1, Author
Affiliations:
1External Organizations, ou_persistent22              
2Division Prof. Dr. Joachim H. Ullrich, MPI for Nuclear Physics, Max Planck Society, ou_904547              

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 Dates: 20112011
 Publication Status: Issued
 Pages: 5
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Degree: -

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Title: Physical review B
Source Genre: Journal
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Publ. Info: Woodbury, NY : Published by the American Physical Society through the American Institute of Physics
Pages: - Volume / Issue: 84 (2) Sequence Number: 024119 Start / End Page: - Identifier: ISSN: 1098-0121
CoNE: https://pure.mpg.de/cone/journals/resource/954925225008