Surface analysis of SI(111) wafers using 2nd-harmonic generation

Hillrichs, G.; Graf, D.; Marowsky, G.; Roders, O.; Schnegg, A.; Wagner, P.

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Surface analysis of SI(111) wafers using 2nd-harmonic generation

Hillrichs, G., Graf, D., Marowsky, G., Roders, O., Schnegg, A., & Wagner, P. (1994). Surface analysis of SI(111) wafers using 2nd-harmonic generation. Journal of the Electrochemical Society, 141(11), 3145-3151.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0013-0443-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0027-EA5B-A

Genre: Journal Article

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Creators:
Hillrichs, G., Author
Graf, D.¹, Author
Marowsky, G.², Author
Roders, O., Author
Schnegg, A., Author
Wagner, P., Author

Affiliations:
1Research Group on Circadian Rythms, MPI for biophysical chemistry, Max Planck Society, ou_578594
2Abteilung Laserphysik, MPI for biophysical chemistry, Max Planck Society, ou_578547

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Language(s): eng - English

Dates: Date issued: 1994-11

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 274297
ISI: A1994PQ52400037

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Title: Journal of the Electrochemical Society

Alternative Title : J. Electrochem. Soc.

Source Genre: Journal

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Pages: - Volume / Issue: 141 (11) Sequence Number: - Start / End Page: 3145 - 3151 Identifier: ISSN: 0013-4651