Silicon pore X-ray optics for IXO

Collon, Maximilien J.; Günther, Ramses; Ackermann, Marcelo; Partapsing, Rakesh; Vacanti, Giuseppe; Beijersbergen, Marco W.; Bavdaz, Marcos; Wille, Eric; Wallace, Kotska; Riekerink, Mark Olde; Lansdorp, Bob; de Vrede, Lennart; van Baren, Coen; Müller, Peter; Krumrey, Michael; Freyberg, M.

doi:10.1117/12.858166

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Silicon pore X-ray optics for IXO

Collon, M. J., Günther, R., Ackermann, M., Partapsing, R., Vacanti, G., Beijersbergen, M. W., et al. (2010). Silicon pore X-ray optics for IXO. In M. Arnaud, S. S. Murray, & T. Takahashi (Eds.), Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray (pp. 1-9).

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0012-D30C-5 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0012-D30F-0

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Creators:
Collon, Maximilien J., Author
Günther, Ramses, Author
Ackermann, Marcelo, Author
Partapsing, Rakesh, Author
Vacanti, Giuseppe, Author
Beijersbergen, Marco W., Author
Bavdaz, Marcos, Author
Wille, Eric, Author
Wallace, Kotska, Author
Riekerink, Mark Olde, Author
Lansdorp, Bob, Author
de Vrede, Lennart, Author
van Baren, Coen, Author
Müller, Peter, Author
Krumrey, Michael, Author
Freyberg, M.¹, Author

Affiliations:
1High Energy Astrophysics, MPI for Extraterrestrial Physics, Max Planck Society, ou_159890

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Language(s): eng - English

Dates: Date issued: 2010

Publication Status: Issued

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Identifiers: DOI: 10.1117/12.858166
Other: LOCALID: AS 24/83 I, p.77321F

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Title: Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray

Place of Event: San Diego, CA, USA

Start-/End Date: 2010-06-28 - 2010-07-02

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Title: Space Telescopes and Instrumentation 2010: Ultraviolet to Gamma Ray

Source Genre: Proceedings

Creator(s):
Arnaud, Monique, Editor
Murray, Stephen S., Editor
Takahashi, Tadayuki, Editor

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Pages: - Volume / Issue: - Sequence Number: 77321F Start / End Page: 1 - 9 Identifier: ISBN: 978-0-8194-8222-8

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Title: Proceedings of SPIE

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Pages: - Volume / Issue: 7732 Sequence Number: - Start / End Page: - Identifier: ISSN: 0277-786X