非表示:
キーワード:
transmission electron microscopy, CCD camera, noise reduction, cosmic rays, x-ray noise, dark reference
要旨:
This publication is a systematic investigation of the effect the improvement of dark-reference images has on the resulting bright-field images. For this, data were acquired with three different charge-coupled device cameras attached to two different transmission electron microscopes. Multi-frame acquisitions and methods to correct X-ray noise are introduced and quantified as options to improve the dark-reference images. Furthermore, the influence of X-ray noise on transmission electron microscopy measurements is discussed and observations on its composition are shared.
