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  Electron microscopic image acquisition

Stegmann, H., Wepf, R., & Schröder, R. R. (1999). Electron microscopic image acquisition. In B. Jähne (Ed.), Handbook of computer vision and applications, Vol. I: Sensors and imaging (pp. 348-386). New York: Academ. Press.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-3BCE-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0028-3BCF-9
Genre: Book Chapter
Alternative Title : Electron microscopic image acquisition

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HdbkComputerVisonApplicat_1_1999_348.pdf (Any fulltext), 2MB
 
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 Creators:
Stegmann, Heiko1, Author           
Wepf, R., Author
Schröder, Rasmus R.1, 2, Author           
Affiliations:
1Emeritus Group Biophysics, Max Planck Institute for Medical Research, Max Planck Society, ou_1497712              
2Department of Biomolecular Mechanisms, Max Planck Institute for Medical Research, Max Planck Society, ou_1497700              

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Language(s): eng - English
 Dates: 1999
 Publication Status: Issued
 Pages: 39
 Publishing info: -
 Table of Contents: -
 Rev. Type: Internal
 Identifiers: eDoc: 666493
Other: 4510
 Degree: -

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Title: Handbook of computer vision and applications, Vol. I: Sensors and imaging
Source Genre: Book
 Creator(s):
Jähne, B., Editor
Affiliations:
-
Publ. Info: New York : Academ. Press
Pages: - Volume / Issue: 1 Sequence Number: - Start / End Page: 348 - 386 Identifier: ISBN: 0-12-379771-3