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  Automated identification and classification of single particle serial femtosecond X-ray diffraction data

Andreasson, J., Martin, A. V., Liang, M., Timneanu, N., Aquila, A., Wang, F., et al. (2014). Automated identification and classification of single particle serial femtosecond X-ray diffraction data. Optics Express, 22(3), 2497-2510. doi:10.1364/OE.22.002497.

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 Urheber:
Andreasson, Jakob, Autor
Martin, Andrew V., Autor
Liang, Meng, Autor
Timneanu, Nicusor, Autor
Aquila, Andrew, Autor
Wang, Fenglin, Autor
Iwan, Bianca, Autor
Svenda, Martin, Autor
Ekeberg, Tomas, Autor
Hantke, Max, Autor
Bielecki, Johan, Autor
Rolles, Daniel1, Autor           
Rudenko, Artem, Autor
Foucar, Lutz1, Autor           
Hartmann, Robert, Autor
Erk, Benjamin1, Autor           
Rudek, Benedikt1, Autor           
Chapman, Henry N., Autor
Hajdu, Janos, Autor
Barty, Anton, Autor
Affiliations:
1Department of Biomolecular Mechanisms, Max Planck Institute for Medical Research, Max Planck Society, Jahnstrasse 29, 69120 Heidelberg, DE, ou_1497700              

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 Zusammenfassung: The first hard X-ray laser, the Linac Coherent Light Source (LCLS), produces 120 shots per second. Particles injected into the X-ray beam are hit randomly and in unknown orientations by the extremely intense X-ray pulses, where the femtosecond-duration X-ray pulses diffract from the sample before the particle structure is significantly changed even though the sample is ultimately destroyed by the deposited X-ray energy. Single particle X-ray diffraction experiments generate data at the FEL repetition rate, resulting in more than 400,000 detector readouts in an hour, the data stream during an experiment contains blank frames mixed with hits on single particles, clusters and contaminants. The diffraction signal is generally weak and it is superimposed on a low but continually fluctuating background signal, originating from photon noise in the beam line and electronic noise from the detector. Meanwhile, explosion of the sample creates fragments with a characteristic signature. Here, we describe methods based on rapid image analysis combined with ion Time-of-Flight (ToF) spectroscopy of the fragments to achieve an efficient, automated and unsupervised sorting of diffraction data. The studies described here form a basis for the development of real-time frame rejection methods, e.g. for the European XFEL, which is expected to produce 100 million pulses per hour.

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Sprache(n): eng - English
 Datum: 2013-11-112014-01-072014-02-10
 Publikationsstatus: Erschienen
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 Ort, Verlag, Ausgabe: -
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 Art der Begutachtung: Expertenbegutachtung
 Identifikatoren: Anderer: 7980
DOI: 10.1364/OE.22.002497
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Titel: Optics Express
Genre der Quelle: Zeitschrift
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Ort, Verlag, Ausgabe: Washington, DC : Optical Society of America
Seiten: - Band / Heft: 22 (3) Artikelnummer: - Start- / Endseite: 2497 - 2510 Identifikator: ISSN: 1094-4087
CoNE: https://pure.mpg.de/cone/journals/resource/954925609918