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  Ultrafast reciprocal-space mapping with a convergent beam

Schick, D., Shayduk, R., Bojahr, A., Herzog, M., von Schmising, C. K., Gaal, P., et al. (2013). Ultrafast reciprocal-space mapping with a convergent beam. Journal of Applied Crystallography, 46(5), 1372-1377. doi:10.1107/S0021889813020013.

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RecipSpaceMap.pdf (Any fulltext), 340KB
 
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 Creators:
Schick, Daniel1, Author
Shayduk, Roman2, Author
Bojahr, André1, Author
Herzog, Marc1, 3, Author           
von Schmising, Clemens Korff4, Author
Gaal, Peter2, Author
Bargheer, Matias1, 2, Author
Affiliations:
1Institut für Physik and Astronomie, Universität Potsdam, Karl-Liebknecht-Strasse 24-25, 14476 Potsdam, Germany, ou_persistent22              
2Helmholtz-Zentrum Berlin für Materialien und Energie GmbH, Wilhelm-Conrad-Röntgen Campus, BESSY II, Albert-Einstein-Strasse 15, 12489 Berlin, Germany, ou_persistent22              
3Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546              
4Institut für Optik und Atomare Physik, Technische Universität Berlin, Strasse des 17 Juni 135, 10623 Berlin, Germany, ou_persistent22              

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Free keywords: reciprocal-space mapping;time-resolved X-ray diffraction;convergent beams;resolution functions;plasma X-ray sources
 Abstract: A diffractometer setup is presented, based on a laser-driven plasma X-ray source for reciprocal-space mapping with femtosecond temporal resolution. In order to map out the reciprocal space, an X-ray optic with a convergent beam is used with an X-ray area detector to detect symmetrically and asymmetrically diffracted X-ray photons simultaneously. The setup is particularly suited for measuring thin films or imperfect bulk samples with broad rocking curves. For quasi-perfect crystalline samples with insignificant in-plane Bragg peak broadening, the measured reciprocal-space maps can be corrected for the known resolution function of the diffractometer in order to achieve high-resolution rocking curves with improved data quality. In this case, the resolution of the diffractometer is not limited by the convergence of the incoming X-ray beam but is solely determined by its energy bandwidth.

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Language(s): eng - English
 Dates: 2013-05-242013-07-192013-10
 Publication Status: Issued
 Pages: 6
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: DOI: 10.1107/S0021889813020013
 Degree: -

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Title: Journal of Applied Crystallography
Source Genre: Journal
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Publ. Info: Oxford, England : Blackwell Publishing on behalf of the International Union of Crystallography
Pages: - Volume / Issue: 46 (5) Sequence Number: - Start / End Page: 1372 - 1377 Identifier: ISSN: 0021-8898
CoNE: https://pure.mpg.de/cone/journals/resource/954925410812