Interfacial Spectroscopy: a Tool for Characterization of Semiconductor Surface 
Structures and Surface Solvation

Campen, Kramer

Lokale TagsFreigabegeschichteDetailsÜbersicht

Interfacial Spectroscopy: a Tool for Characterization of Semiconductor Surface Structures and Surface Solvation

Campen, K. (2013). Interfacial Spectroscopy: a Tool for Characterization of Semiconductor Surface Structures and Surface Solvation. Talk presented at Integrated Research Training Group Seminar on Elementary Processes in Molecular Switches: Collaborative Research Center 658, Technische Universität. Berlin, Germany. 2013-03.

Item is Freigegeben

einblenden: alle ausblenden: alle

Basisdaten

einblenden: ausblenden:

Datensatz-Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-56C3-4 Versions-Permalink: https://hdl.handle.net/11858/00-001M-0000-0014-570F-5

Genre: Vortrag

ausblenden:

Urheber:
Campen, Kramer¹, Autor

Affiliations:
1Physical Chemistry, Fritz Haber Institute, Max Planck Society, ou_634546

Inhalt

einblenden:

Details

einblenden:

Veranstaltung

einblenden:

ausblenden:

Titel: Integrated Research Training Group Seminar on Elementary Processes in Molecular Switches: Collaborative Research Center 658, Technische Universität

Veranstaltungsort: Berlin, Germany

Start-/Enddatum: 2013-03

Eingeladen: Ja