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  The X-ray object recognition test (X-ray ORT): a reliable and valid instrument for measuring visual abilities needed in X-ray screening

Hardmeier, D., Hofer, F., & Schwaninger, A. (2005). The X-ray object recognition test (X-ray ORT): a reliable and valid instrument for measuring visual abilities needed in X-ray screening. In 39th Annual 2005 International Carnahan Conference on Security Technology (pp. 189-192). Piscataway, NJ, USA: IEEE.

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 Urheber:
Hardmeier, D, Autor
Hofer, F, Autor
Schwaninger, A1, Autor           
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1External Organizations, ou_persistent22              

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 Zusammenfassung: Aviation security screening has become very important in recent years. It was shown in [1] that certain image-based factors influence detection when visually inspecting x-ray images of passenger bags. Threat items are more difficult to recognize when placed in close-packed bags (effect of bag complexity), when superimposed by other objects (effect of superposition), and when rotated (effect of viewpoint). The X-Ray Object Recognition Test (X-Ray ORT) was developed to measure the abilities needed to cope with these factors. In this study, we examined the reliability and validity of the X-Ray ORT based on a sample of 453 aviation security screeners and 453 novices. Cronbach Alpha and split-half analysis revealed high reliability. Validity was examined using internal, convergent, discriminant and criterion-related validity estimates. The results show that the X-Ray ORT is a reliable and valid instrument for measuring visual abilities needed in x-ray screening. This makes the X-Ray ORT an interesting tool for com
petency and pre-employment assessment purposes.

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 Datum: 2005-10
 Publikationsstatus: Erschienen
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 Identifikatoren: DOI: 10.1109/CCST.2005.1594876
BibTex Citekey: 3408
 Art des Abschluß: -

Veranstaltung

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Titel: 39th Annual International Carnahan Conference on Security Technology (IEEE ICCST 2005)
Veranstaltungsort: Gran Canaria, Spain
Start-/Enddatum: 2005-10-11 - 2005-10-14

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Titel: 39th Annual 2005 International Carnahan Conference on Security Technology
Genre der Quelle: Konferenzband
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Ort, Verlag, Ausgabe: Piscataway, NJ, USA : IEEE
Seiten: - Band / Heft: - Artikelnummer: - Start- / Endseite: 189 - 192 Identifikator: ISBN: 0-7803-9245-0