English
 
Help Privacy Policy Disclaimer
  Advanced SearchBrowse

Item

ITEM ACTIONSEXPORT
 
 
DownloadE-Mail
  Point-spread functions for backscattered imaging in the scanning electron microscope

Hennig, P., & Denk, W. (2007). Point-spread functions for backscattered imaging in the scanning electron microscope. Journal of Applied Physics, 102(12): 123101, pp. 1-8. doi:10.1063/1.2817591.

Item is

Files

show Files

Locators

show
hide
Description:
-
OA-Status:

Creators

show
hide
 Creators:
Hennig, P1, Author           
Denk, W, Author
Affiliations:
1External Organizations, ou_persistent22              

Content

show
hide
Free keywords: -
 Abstract: One knows the imaging system's properties are central to the correct interpretation of any image. In a scanning electron microscope regions of different composition generally interact in a highly nonlinear way during signal generation. Using Monte Carlo simulations we found that in resin-embedded, heavy metal-stained biological specimens staining is sufficiently dilute to allow an approximately linear treatment. We then mapped point-spread functions for backscattered-electron contrast, for primary energies of 3 and 7 keV and for different detector specifications. The point-spread functions are surprisingly well confined (both laterally and in depth) compared even to the distribution of only those scattered electrons that leave the sample again.

Details

show
hide
Language(s):
 Dates: 2007-12
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: -
 Identifiers: DOI: 10.1063/1.2817591
BibTex Citekey: HennigD2007
 Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show
hide
Title: Journal of Applied Physics
  Abbreviation : J. Appl. Phys.
Source Genre: Journal
 Creator(s):
Affiliations:
Publ. Info: New York, NY : AIP Publishing
Pages: - Volume / Issue: 102 (12) Sequence Number: 123101 Start / End Page: 1 - 8 Identifier: ISSN: 0021-8979
CoNE: https://pure.mpg.de/cone/journals/resource/991042723401880