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  X-ray/atomic force microscopy study of the temperature-dependent multilayer structure of PTCDI-C8 films on SiO2

Krauss, T. N., Barrena, E., de Oteyza, D. G., Zhang, X. N., Major, J., Dehm, V., et al. (2009). X-ray/atomic force microscopy study of the temperature-dependent multilayer structure of PTCDI-C8 films on SiO2. Journal of Physical Chemistry C, 113(11), 4502-4506. doi:10.1021/jp808037w.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-75E3-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-75E4-4
Genre: Journal Article

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 Creators:
Krauss, T. N.1, Author           
Barrena, E.1, Author           
de Oteyza, D. G.1, Author           
Zhang, X. N.1, Author
Major, J.1, Author           
Dehm, V.2, Author
Würthner, F.2, Author
Dosch, H.1, 2, Author           
Affiliations:
1Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645              
2Institut für Theoretische und Angewandte Physik, Pfaffenwaldring 57, 70550 Stuttgart, Germany;Institut für Organische Chemie, Am Hubland, Universität Würzburg, 97074 Würzburg, Germany, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Dosch/Rühle;
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Language(s): eng - English
 Dates: 2009-02-20
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 415185
DOI: 10.1021/jp808037w
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Title: Journal of Physical Chemistry C
Source Genre: Journal
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Pages: - Volume / Issue: 113 (11) Sequence Number: - Start / End Page: 4502 - 4506 Identifier: -