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  Tip microscopy-top microscopy? An introduction

Baumeister, W. (1988). Tip microscopy-top microscopy? An introduction. Ultramicroscopy, 25(2), 103-105.

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Baumeister, W.1, Author           
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1External Organizations, ou_persistent22              

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Free keywords: Reviews; Scanning tunnelling microscopy; Reviews and tutorial papers; resource letters [A0130R]; Electron and ion microscopes and techniques [A0780]; Electron microscopy determinations of structures [A6116D]
 Abstract: The author presents an introduction to the applications of scanning tunnelling microscopy. He shows that the tip of a STM is not only capable of recording an image. It can also be used to act mechanically, i.e., it can be used as a device for micromanipulation on an extremely small scale. (15 References).

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 Dates: 1988
 Publication Status: Issued
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 Identifiers: eDoc: 318365
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Title: Ultramicroscopy
Source Genre: Journal
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Pages: - Volume / Issue: 25 (2) Sequence Number: - Start / End Page: 103 - 105 Identifier: -