Measuring projected potential profiles across interfaces by reconstructing the 
exit face wave function from through focal series images

Bhattacharyya, S.; Koch, C. T.; Rühle, M.

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Measuring projected potential profiles across interfaces by reconstructing the exit face wave function from through focal series images

Bhattacharyya, S., Koch, C. T., & Rühle, M. (2006). Measuring projected potential profiles across interfaces by reconstructing the exit face wave function from through focal series images. In Proceedings of the 16th International Microscopy Congress 2006 (pp. 1138-1138). International Federation of Societies in Microscopy.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4894-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-4895-4

Genre: Conference Paper

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Creators:
Bhattacharyya, S., Author
Koch, C. T.¹, Author
Rühle, M.², Author

Affiliations:
1Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
2Emeriti and Others, Max Planck Institute for Intelligent Systems, Max Planck Society, DE, ou_1497650

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Free keywords: MPI für Metallforschung; Emeriti and Others; Stuttgart Center for Electron Microscopy (StEM);

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Language(s): eng - English

Dates: Date issued: 2006

Publication Status: Issued

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Identifiers: eDoc: 319004

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Title: 16th International Microscopy Congress - IMC16

Place of Event: Sapporo, Japan

Start-/End Date: 2006-09-03 - 2006-09-08

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Title: Proceedings of the 16th International Microscopy Congress 2006

Source Genre: Proceedings

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Publ. Info: International Federation of Societies in Microscopy

Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 1138 - 1138 Identifier: -