Annealing effect on ion conduction of nanosized CaF2/BaF2 multilayers

Guo, X. X.; Matei, I.; Jin-Phillipp, N. Y.; van Aken, P. A.; Maier, J.

doi:10.1063/1.3143623

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Annealing effect on ion conduction of nanosized CaF₂/BaF₂ multilayers

Guo, X. X., Matei, I., Jin-Phillipp, N. Y., van Aken, P. A., & Maier, J. (2009). Annealing effect on ion conduction of nanosized CaF₂/BaF₂ multilayers. Journal of Applied Physics, 105: 114321. doi:10.1063/1.3143623.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3DE2-4 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3DE3-2

Genre: Journal Article

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Creators:
Guo, X. X.¹, Author
Matei, I.², Author
Jin-Phillipp, N. Y.^{3, 4, 5}, Author
van Aken, P. A.⁵, Author
Maier, J.², Author

Affiliations:
1Former Dept. Theory of Mesoscopic Phenomena, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497656
2Max Planck Society, ou_persistent13
3Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
4Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
5Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

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Free keywords: MPI für Metallforschung; MPI für Festkörperforschung; Stuttgart Center for Electron Microscopy (StEM); Maier;

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Language(s): eng - English

Dates: Date issued: 2009

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 432258
DOI: 10.1063/1.3143623

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Title: Journal of Applied Physics

Source Genre: Journal

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Pages: - Volume / Issue: 105 Sequence Number: 114321 Start / End Page: - Identifier: -