Residual stress and strain-free lattice-parameter depth profiles in a γ’-Fe4N1-x
 layer on an α-Fe substrate measured by X-ray diffraction stress analysis at 
constant information depth

Wohlschlögel, M.; Welzel, U.; Mittemeijer, E. J.

doi:10.1557/JMR.2009.0153

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Residual stress and strain-free lattice-parameter depth profiles in a γ’-Fe₄N_1-x layer on an α-Fe substrate measured by X-ray diffraction stress analysis at constant information depth

Wohlschlögel, M., Welzel, U., & Mittemeijer, E. J. (2009). Residual stress and strain-free lattice-parameter depth profiles in a γ’-Fe₄N_1-x layer on an α-Fe substrate measured by X-ray diffraction stress analysis at constant information depth. Journal of Materials Research, 24, 1342-1352. doi:10.1557/JMR.2009.0153.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3DD2-8 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3DD3-6

Genre: Journal Article

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Creators:
Wohlschlögel, M.¹, Author
Welzel, U.¹, Author
Mittemeijer, E. J.^{1, 2}, Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;

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Dates: Date issued: 2009

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Rev. Type: Peer

Identifiers: eDoc: 430726
DOI: 10.1557/JMR.2009.0153

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Title: Journal of Materials Research

Source Genre: Journal

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Pages: - Volume / Issue: 24 Sequence Number: - Start / End Page: 1342 - 1352 Identifier: -