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  Residual stress and strain-free lattice-parameter depth profiles in a γ’-Fe4N1-x layer on an α-Fe substrate measured by X-ray diffraction stress analysis at constant information depth

Wohlschlögel, M., Welzel, U., & Mittemeijer, E. J. (2009). Residual stress and strain-free lattice-parameter depth profiles in a γ’-Fe4N1-x layer on an α-Fe substrate measured by X-ray diffraction stress analysis at constant information depth. Journal of Materials Research, 24, 1342-1352. doi:10.1557/JMR.2009.0153.

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Wohlschlögel, M.1, Author           
Welzel, U.1, Author           
Mittemeijer, E. J.1, 2, Author           
Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644              
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;
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 Dates: 2009
 Publication Status: Issued
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 Rev. Type: Peer
 Identifiers: eDoc: 430726
DOI: 10.1557/JMR.2009.0153
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Title: Journal of Materials Research
Source Genre: Journal
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Pages: - Volume / Issue: 24 Sequence Number: - Start / End Page: 1342 - 1352 Identifier: -