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  Various transmission electron microscopic techniques to characterize phase separation – illustrated using a LaF3 containing aluminosilicate glass

Bhattacharyya, S., Höche, T., Hahn, K., & van Aken, P. A. (2009). Various transmission electron microscopic techniques to characterize phase separation – illustrated using a LaF3 containing aluminosilicate glass. Journal of Non-Crystalline Solids, 355, 393-396. doi:10.1016/j.jnoncrysol.2008.12.005.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3DAC-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3DAD-D
Genre: Journal Article

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 Creators:
Bhattacharyya, S.1, Author           
Höche, T.2, Author
Hahn, K.1, 3, Author           
van Aken, P. A.3, Author           
Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657              
2Leibniz-Institut für Oberflächenmodifizierung e. V., Permoserstraße 15, D-04318 Leipzig, Germany, ou_persistent22              
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669              

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Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);
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Language(s): eng - English
 Dates: 2009
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 429103
DOI: 10.1016/j.jnoncrysol.2008.12.005
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Title: Journal of Non-Crystalline Solids
Source Genre: Journal
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Publ. Info: -
Pages: - Volume / Issue: 355 Sequence Number: - Start / End Page: 393 - 396 Identifier: -