Off-axis and inline electron holography: A quantitative comparison

Koch, C. T.; Lubk, A.

doi:10.1016/j.ultramic.2009.11.022

Local TagsRelease HistoryDetailsSummary

Off-axis and inline electron holography: A quantitative comparison

Koch, C. T., & Lubk, A. (2010). Off-axis and inline electron holography: A quantitative comparison. Ultramicroscopy, 110, 460-471. doi:10.1016/j.ultramic.2009.11.022.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3BB6-3 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3BB7-1

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Koch, C. T.^{1, 2}, Author
Lubk, A.³, Author

Affiliations:
1Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
2Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669
3Technische Universität Dresden,Triebenberg Lab, Zum Triebenberg 50, 01328Dresden, Germany, ou_persistent22

Content

show

hide

Free keywords: MPI für Metallforschung; Stuttgart Center for Electron Microscopy (StEM);

Abstract: -

Details

show

hide

Language(s): eng - English

Dates: Date issued: 2010

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: Peer

Identifiers: eDoc: 478114
DOI: 10.1016/j.ultramic.2009.11.022

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Ultramicroscopy

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 110 Sequence Number: - Start / End Page: 460 - 471 Identifier: -