Molecular heterojunction morphology on rough substrate surfaces: component 
separation by Fourier subtraction

Turak, A.; Heidkamp, J.; Dosch, H.

doi:10.1088/0957-4484/28/285705

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Molecular heterojunction morphology on rough substrate surfaces: component separation by Fourier subtraction

Turak, A., Heidkamp, J., & Dosch, H. (2010). Molecular heterojunction morphology on rough substrate surfaces: component separation by Fourier subtraction. Nanotechnology, 21(28): 285705. doi:10.1088/0957-4484/28/285705.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3AC1-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3AC2-D

Genre: Journal Article

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Creators:
Turak, A.¹, Author
Heidkamp, J.², Author
Dosch, H.^{2, 3}, Author

Affiliations:
1Max Planck Society, ou_persistent13
2Dept. Metastable and Low-Dimensional Materials, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497645
3Universität Stuttgart, Institut für Theoretische und Angewandte Physik, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Dosch/Rühle;

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Language(s): eng - English

Dates: Date issued: 2010-06-28

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 479773
DOI: 10.1088/0957-4484/28/285705

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Title: Nanotechnology

Source Genre: Journal

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Pages: - Volume / Issue: 21 (28) Sequence Number: 285705 Start / End Page: - Identifier: -