Stress in thin films; X-ray diffraction analysis and grain interaction

Welzel, U.; Leoni, M.; Lamparter, P.; Mittemeijer, E. J.

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Stress in thin films; X-ray diffraction analysis and grain interaction

Welzel, U., Leoni, M., Lamparter, P., & Mittemeijer, E. J. (2000). Stress in thin films; X-ray diffraction analysis and grain interaction. Powder Diffraction Newsletter, 24, 4-6.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3945-2 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-3946-F

Genre: Journal Article

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Creators:
Welzel, U.¹, Author
Leoni, M., Author
Lamparter, P.¹, Author
Mittemeijer, E. J.^{1, 2}, Author

Affiliations:
1Dept. Phase Transformations; Thermodynamics and Kinetics, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497644
2Universität Stuttgart, Institut für Materialwissenschaft, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Mittemeijer;

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Dates: Date issued: 2000

Publication Status: Issued

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Identifiers: eDoc: 200648

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Title: Powder Diffraction Newsletter

Source Genre: Journal

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Pages: - Volume / Issue: 24 Sequence Number: - Start / End Page: 4 - 6 Identifier: -