Submicron X-ray diffraction and its applications to problems in materials and 
environmental science.

Tamura, N.; Celestre, R. S.; MacDowell, A. A.; Padmore, H. A.; Spolenak, R.; Valek, B. C.; Chang, N. M.; Manceau, A.; Patel, J. R.

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Submicron X-ray diffraction and its applications to problems in materials and environmental science.

Tamura, N., Celestre, R. S., MacDowell, A. A., Padmore, H. A., Spolenak, R., Valek, B. C., et al. (2002). Submicron X-ray diffraction and its applications to problems in materials and environmental science. Review of Scientific Instruments, 73(3), 1369-1372.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-31C9-B Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-31CA-9

Genre: Journal Article

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Creators:
Tamura, N., Author
Celestre, R. S., Author
MacDowell, A. A., Author
Padmore, H. A., Author
Spolenak, R.¹, Author
Valek, B. C., Author
Chang, N. M., Author
Manceau, A., Author
Patel, J. R., Author

Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655

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Free keywords: MPI für Metallforschung; Abt. Arzt;

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Language(s): eng - English

Dates: Date issued: 2002-03-03

Publication Status: Issued

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Identifiers: eDoc: 55945

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Title: Review of Scientific Instruments

Source Genre: Journal

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Pages: - Volume / Issue: 73 (3) Sequence Number: - Start / End Page: 1369 - 1372 Identifier: -