A quantitative nanodiffraction system for ultrahigh vacuum scanning 
transmission electron microscopy

Hembree, G.G.; Koch, C.; Spence, J. C. H.

Local TagsRelease HistoryDetailsSummary

A quantitative nanodiffraction system for ultrahigh vacuum scanning transmission electron microscopy

Hembree, G., Koch, C., & Spence, J. C. H. (2003). A quantitative nanodiffraction system for ultrahigh vacuum scanning transmission electron microscopy. Microscopy and Microanalysis, 9, 468-474.

Item is Released

show all hide all

Basic

show hide

Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2F1D-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2F1E-D

Genre: Journal Article

Files

show Files

Locators

show

Creators

show

hide

Creators:
Hembree, G.G.¹, Author
Koch, C.^{2, 3}, Author
Spence, J. C. H.¹, Author

Affiliations:
1Department of Physics & Astronomy Arizona State University, Tempe, AZ, USA, ou_persistent22
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657
3Stuttgart Center for Electron Microscopy, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497669

Content

show

hide

Free keywords: MPI für Metallforschung; Ehemalige Abt. Rühle;

Abstract: -

Details

show

hide

Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

Pages: -

Publishing info: -

Table of Contents: -

Rev. Type: Peer

Identifiers: eDoc: 127095

Degree: -

Event

show

Legal Case

show

Project information

show

Source 1

show

hide

Title: Microscopy and Microanalysis

Source Genre: Journal

Creator(s):

Affiliations:

Publ. Info: -

Pages: - Volume / Issue: 9 Sequence Number: - Start / End Page: 468 - 474 Identifier: -