Analysis of mismatched heterointerfaces by combinded HREM image processing and 
modeling

Möbus, G.; Levay, A.; Inkson, B. J.; Hytch, M.; Trampert, A.; Wagner, T.

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Analysis of mismatched heterointerfaces by combinded HREM image processing and modeling

Möbus, G., Levay, A., Inkson, B. J., Hytch, M., Trampert, A., & Wagner, T. (2003). Analysis of mismatched heterointerfaces by combinded HREM image processing and modeling. Zeitschrift für Metallkunde, 94, 358-367.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2DD4-0 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2DD5-E

Genre: Journal Article

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Creators:
Möbus, G.¹, Author
Levay, A.¹, Author
Inkson, B. J.¹, Author
Hytch, M.¹, Author
Trampert, A.¹, Author
Wagner, T.², Author

Affiliations:
1University of Oxford, ou_persistent22
2Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640

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Free keywords: MPI für Metallforschung; Abt. Arzt; ZWE Dünnschichtlabor; strain mapping; misfit dislocations; semiconductor interfaces; intermetallic alloys; dislocation networks; molecular modelling; quantitative HREM

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Language(s): eng - English

Dates: Date issued: 2003

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 51193

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Title: Zeitschrift für Metallkunde

Source Genre: Journal

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Pages: - Volume / Issue: 94 Sequence Number: - Start / End Page: 358 - 367 Identifier: -