Nanobeam propagation and imaging in a FEGTEM/STEM

Möbus, G.; Nufer, S.

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Nanobeam propagation and imaging in a FEGTEM/STEM

Möbus, G., & Nufer, S. (2003). Nanobeam propagation and imaging in a FEGTEM/STEM. Ultramicroscopy, 96(3-4), 285-298.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2C50-D Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2C51-B

Genre: Journal Article

Alternative Title : Ultramicroscopy

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Creators:
Möbus, G.¹, Author
Nufer, S.², Author

Affiliations:
1Univ Oxford, Dept Mat, Oxford OX1 3PH, England., ou_persistent22
2Former Dept. Microstructure Interfaces, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497657

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Free keywords: MPI für Metallforschung; Abt. Rühle; EELS, ELNES, ab-initio calculations, multislice method, Cs-correction, coherent CBED, density-of-states, grain boundaries, sapphire

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Language(s): eng - English

Dates: Date issued: 2003-09

Publication Status: Issued

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Identifiers: eDoc: 112699
ISI: 000184402100006

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Title: Ultramicroscopy

Alternative Title : Ultramicroscopy

Source Genre: Journal

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Pages: - Volume / Issue: 96 (3-4) Sequence Number: - Start / End Page: 285 - 298 Identifier: ISSN: 0304-3991