Thermal stability of Ti and Pt nanowires manufactured by Ga+ focused ion beam

Inkson, B. J.; Dehm, G.; Wagner, T.

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Thermal stability of Ti and Pt nanowires manufactured by Ga+ focused ion beam

Inkson, B. J., Dehm, G., & Wagner, T. (2004). Thermal stability of Ti and Pt nanowires manufactured by Ga+ focused ion beam. Journal of Microscopy, 214, 252-260.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2AA8-A Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2AA9-8

Genre: Journal Article

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Creators:
Inkson, B. J.¹, Author
Dehm, G.², Author
Wagner, T.³, Author

Affiliations:
1University of Sheffield, U.K., ou_persistent22
2Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655
3Central Scientific Facility Thin Film Laboratory, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497640

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Free keywords: MPI für Metallforschung; Abt. Arzt; ZWE Dünnschichtlabor;

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Language(s): eng - English

Dates: Date issued: 2004

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 175366

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Title: Journal of Microscopy

Source Genre: Journal

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Pages: - Volume / Issue: 214 Sequence Number: - Start / End Page: 252 - 260 Identifier: -