Tensile testing of ultrathin polycrystalline films: A new synchrotron based 
method

Böhm, J.; Gruber, P.; Spolenak, R.; Stierle, A.; Wanner, A.; Arzt, E.

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Tensile testing of ultrathin polycrystalline films: A new synchrotron based method

Böhm, J., Gruber, P., Spolenak, R., Stierle, A., Wanner, A., & Arzt, E. (2004). Tensile testing of ultrathin polycrystalline films: A new synchrotron based method. Review of Scientific Instruments, 75(4), 1110-1119.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2964-C Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0010-2965-A

Genre: Journal Article

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Creators:
Böhm, J.¹, Author
Gruber, P.¹, Author
Spolenak, R.¹, Author
Stierle, A.², Author
Wanner, A.¹, Author
Arzt, E.^{1, 3}, Author

Affiliations:
1Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655
2Former Central Scientific Facility ANKA Synchroton Beamline, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497651
3Universität Stuttgart, Institut für Metallkunde, ou_persistent22

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Free keywords: MPI für Metallforschung; Abt. Arzt; Abt. Dosch; ZWE MF-ANKA-Beamline;

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Language(s): eng - English

Dates: Date issued: 2004-03-16

Publication Status: Issued

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Rev. Type: Peer

Identifiers: eDoc: 125011

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Title: Review of Scientific Instruments

Source Genre: Journal

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Pages: - Volume / Issue: 75 (4) Sequence Number: - Start / End Page: 1110 - 1119 Identifier: -