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  Pipe-diffusion ripening of Si precipitates in Al-0.5% Cu-1%Si thin films

Legros, M., Kaouache, B., Gergaud, P., Thomas, O., Dehm, G., Balk, T. J., et al. (2005). Pipe-diffusion ripening of Si precipitates in Al-0.5% Cu-1%Si thin films. Philosophical Magazine, 85, 3541-3552.

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 Creators:
Legros, M.1, Author
Kaouache, B.1, Author
Gergaud, P.1, Author
Thomas, O.1, Author
Dehm, G.2, Author           
Balk, T. J.2, Author           
Arzt, E.2, 3, Author           
Affiliations:
1CNRS, CEMES, Toulouse, F-31055 France; ENSAM, LPMM, Metz, F-57078 France; Univ. Stuttgart, Institut für Metallkunde, Stuttgart; Univ. Kentucky, Dept. Chem. & Mat. Engn.,Lexington, KY 40506 USA, ou_persistent22              
2Former Dept. Micro/Nanomechanics of Thin Films and Biological Systems, Max Planck Institute for Intelligent Systems, Max Planck Society, ou_1497655              
3Universität Stuttgart, Institut für Metallkunde, ou_persistent22              

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Free keywords: MPI für Metallforschung; Abt. Arzt;
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Language(s): eng - English
 Dates: 2005
 Publication Status: Issued
 Pages: -
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 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 242444
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Title: Philosophical Magazine
Source Genre: Journal
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Pages: - Volume / Issue: 85 Sequence Number: - Start / End Page: 3541 - 3552 Identifier: -