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  Precision Optical Frequency Metrology Using Pulsed Lasers

Udem, T., Holzwarth, R., Zimmermann, M., & Hänsch, T. W. (2002). Precision Optical Frequency Metrology Using Pulsed Lasers. In Y. A. Ono, & K. Fujikawa (Eds.), Foundations of Quantum Mechanics in the Light of New Technology: Proceedings of the 7th International Symposium (pp. 253-258). Singapore: World Scientific.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-C2C2-6 Version Permalink: https://hdl.handle.net/11858/00-001M-0000-0018-CFC1-4
Genre: Conference Paper

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 Creators:
Udem, Thomas1, Author           
Holzwarth, Ronald1, Author           
Zimmermann, Marcus1, Author           
Hänsch, T. W.1, Author           
Affiliations:
1Laser Spectroscopy, Max Planck Institute of Quantum Optics, Max Planck Society, ou_1445568              

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Language(s): eng - English
 Dates: 2002
 Publication Status: Issued
 Pages: -
 Publishing info: -
 Table of Contents: -
 Rev. Type: Peer
 Identifiers: eDoc: 24510
 Degree: -

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Title: ISQM - Tokyo '01
Place of Event: Tokyo
Start-/End Date: 2002-08-27 - 2002-08-30

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Title: Foundations of Quantum Mechanics in the Light of New Technology: Proceedings of the 7th International Symposium
Source Genre: Proceedings
 Creator(s):
Ono, Yoshimasa A., Editor
Fujikawa, Kazuo, Editor
Affiliations:
-
Publ. Info: Singapore : World Scientific
Pages: - Volume / Issue: - Sequence Number: - Start / End Page: 253 - 258 Identifier: ISBN: 981-238-130-9