Determination of Micrometer Length Scales with an X-ray Reflection Ultra 
Small-Angle Scattering Set-Up

Müller-Buschbaum, P.; Casagrande, M.; Gutmann, Jochen S.; Kuhlmann, T.; Stamm, Manfred; von Krosigk, G.; Lode, U.; Cunis, S.; Gehrke, R.

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Determination of Micrometer Length Scales with an X-ray Reflection Ultra Small-Angle Scattering Set-Up

Müller-Buschbaum, P., Casagrande, M., Gutmann, J. S., Kuhlmann, T., Stamm, M., von Krosigk, G., et al. (1998). Determination of Micrometer Length Scales with an X-ray Reflection Ultra Small-Angle Scattering Set-Up. Europhysics Letters, 42, 517-522.

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Item Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-5603-F Version Permalink: https://hdl.handle.net/11858/00-001M-0000-000F-5604-D

Genre: Journal Article

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Creators:
Müller-Buschbaum, P., Author
Casagrande, M.¹, Author
Gutmann, Jochen S.¹, Author
Kuhlmann, T.¹, Author
Stamm, Manfred¹, Author
von Krosigk, G., Author
Lode, U., Author
Cunis, S., Author
Gehrke, R., Author

Affiliations:
1MPI for Polymer Research, Max Planck Society, ou_1309545

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Language(s): eng - English

Dates: Date issued: 1998

Publication Status: Issued

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Identifiers: eDoc: 359301
Other: P-98-77

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Title: Europhysics Letters

Source Genre: Journal

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Pages: - Volume / Issue: 42 Sequence Number: - Start / End Page: 517 - 522 Identifier: -