Müller-Buschbaum, P., Casagrande, M., Gutmann, J. S., Kuhlmann, T., Stamm, M., von Krosigk, G., Lode, U., Cunis, S., & Gehrke, R. (1998). Determination of Micrometer Length Scales with an X-ray Reflection Ultra Small-Angle Scattering Set-Up. Europhysics Letters, 42, 517-522.